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PIC automated probe stations

Partners
OPAL-EC - Advanced wafer-level edge-coupling testing station

OPAL-EC - Advanced wafer-level edge-coupling testing station

Accurate, flexible, fast testing of photonic integrated circuits (PIC) with traceable results.
OPAL-MD - Multi-die automated test station

OPAL-MD - Multi-die automated test station

Accurate, automated, fast testing of photonic integrated circuits (PIC) with traceable results.
OPAL-SD - Single-die automated probe station

OPAL-SD - Single-die automated probe station

Entry-level, flexible, cost-effective and upgradeable. Automated optical alignment and test of photonic integrated circuits (PIC) with traceable results that can be queried. Manual positioning of die and electrical probes.